Issued Patents All Time
Showing 1–25 of 69 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8766659 | Contactor including a covalent bond layer | Yoshihiro Sekizawa, Tomohiro Suzuka | 2014-07-01 |
| 8759119 | Method of testing a semiconductor device and suctioning a semiconductor device in the wafer state | Yasuyuki Itoh, Tetsurou Honda, Kazuhiro Tashiro, Makoto Haseyama, Kenichi Nagashige +2 more | 2014-06-24 |
| 8671557 | Tray in combination with electronic component attaching tool attached to the tray | Daisuke Koizumi, Kazuhiro Tashiro, Naoyuki Watanabe | 2014-03-18 |
| 8404496 | Method of testing a semiconductor device and suctioning a semiconductor device in the wafer state | Yasuyuki Itoh, Tetsurou Honda, Kazuhiro Tashiro, Makoto Haseyama, Kenichi Nagashige +2 more | 2013-03-26 |
| 8268670 | Method of semiconductor device protection | Kazuhiro Tashiro, Keisuke Fukuda, Naohito Kohashi | 2012-09-18 |
| 8164181 | Semiconductor device packaging structure | Kazuhiro Tashiro, Keisuke Fukuda, Naohito Kohashi | 2012-04-24 |
| 8051554 | IC socket with attached electronic component | Daisuke Koizumi, Kazuhiro Tashiro, Naoyuki Watanabe | 2011-11-08 |
| 7921906 | Temperature control method and temperature control device | Hiroshi Misawa, Naohito Kohashi | 2011-04-12 |
| 7807481 | Method of semiconductor device protection, package of semiconductor device | Kazuhiro Tashiro, Keisuke Fukuda, Naohito Kohashi | 2010-10-05 |
| 7795552 | Contact piece member, contactor and contact method | Toru Nishino | 2010-09-14 |
| 7642551 | Wafer-level package having test terminal | — | 2010-01-05 |
| 7518388 | Contactor for electronic components and test method using the same | Kazuhiro Tashiro, Daisuke Koizumi, Takumi Kumatabara, Keisuke Fukuda | 2009-04-14 |
| 7471096 | Contactor for electronic parts and a contact method | Naohito Kohashi, Yoshikazu Arisaka, Hiroyuki Murotani, Katsuhiko Ono | 2008-12-30 |
| 7430798 | Electronic component attaching tool | Daisuke Koizumi, Kazuhiro Tashiro, Naoyuki Watanabe | 2008-10-07 |
| 7403024 | Contactor having contact electrodes of metal springs embedded in a plate-like structure | Kazuhiro Tashiro, Naoyuki Watanabe, Daisuke Koizumi, Takafumi Hashitani, Ei Yano | 2008-07-22 |
| 7399990 | Wafer-level package having test terminal | — | 2008-07-15 |
| 7382046 | Semiconductor device protection cover, and semiconductor device unit including the cover | Kazuhiro Tashiro, Keisuke Fukuda, Naohito Kohashi | 2008-06-03 |
| 7355421 | Semiconductor apparatus testing arrangement and semiconductor apparatus testing method | Yoshikazu Arisaka, Kazuhiro Tashiro, Takayuki Katayama, Tetsu Ozawa, Yuushin Kimura | 2008-04-08 |
| 7309996 | Contactor for electronic components and test method using the same | Kazuhiro Tashiro, Daisuke Koizumi, Takumi Kumatabara, Keisuke Fukuda | 2007-12-18 |
| 7276924 | Electrical connecting method | Toru Nishino | 2007-10-02 |
| 7267559 | Anisotropic conductive sheet, production process, contact structure, electronic device and inspection apparatus for operation test | Takafumi Hashitani | 2007-09-11 |
| 7240432 | Method of manufacturing a semiconductor device testing contactor having a circuit-side contact piece and test-board-side contact piece | Hirohisa Matsuki | 2007-07-10 |
| 7202679 | Contactor having conductive particles in a hole as a contact electrode | Susumu Kida, Naoyuki Watanabe, Takafumi Hashitani, Ei Yano, Ichiro Midorikawa | 2007-04-10 |
| 7196530 | Device testing contactor, method of producing the same, and device testing carrier | Makoto Haseyama | 2007-03-27 |
| 7174629 | Integrated circuit contactor, and method and apparatus for production of integrated circuit contactor | Makoto Haseyama, Futoshi Fukaya, Susumu Moriya, Naomi Miyaji | 2007-02-13 |