Issued Patents All Time
Showing 1–25 of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8759119 | Method of testing a semiconductor device and suctioning a semiconductor device in the wafer state | Shigeyuki Maruyama, Yasuyuki Itoh, Tetsurou Honda, Kazuhiro Tashiro, Kenichi Nagashige +2 more | 2014-06-24 |
| 8404496 | Method of testing a semiconductor device and suctioning a semiconductor device in the wafer state | Shigeyuki Maruyama, Yasuyuki Itoh, Tetsurou Honda, Kazuhiro Tashiro, Kenichi Nagashige +2 more | 2013-03-26 |
| 7304487 | Test method of semiconductor devices | — | 2007-12-04 |
| 7196530 | Device testing contactor, method of producing the same, and device testing carrier | Shigeyuki Maruyama | 2007-03-27 |
| 7174629 | Integrated circuit contactor, and method and apparatus for production of integrated circuit contactor | Shigeyuki Maruyama, Futoshi Fukaya, Susumu Moriya, Naomi Miyaji | 2007-02-13 |
| 7161370 | Semiconductor testing device | Shigeyuki Maruyama, Kazuhiro Tashiro | 2007-01-09 |
| 7112889 | Semiconductor device having an alignment mark formed by the same material with a metal post | Shigeyuki Maruyama, Yasuyuki Itoh, Tetsurou Honda, Kazuhiro Tashiro, Kenichi Nagashige +2 more | 2006-09-26 |
| 7028398 | Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor | Shigeyuki Maruyama | 2006-04-18 |
| 6975126 | Contactor apparatus for semiconductor devices and a test method of semiconductor devices | — | 2005-12-13 |
| 6882169 | Semiconductor testing device | Shigeyuki Maruyama, Kazuhiro Tashiro | 2005-04-19 |
| 6781395 | Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor | Shigeyuki Maruyama, Futoshi Fukaya | 2004-08-24 |
| 6661247 | Semiconductor testing device | Shigeyuki Maruyama, Kazuhiro Tashiro, Futoshi Fukaya | 2003-12-09 |
| 6643922 | Device testing contactor, method of producing the same, and device testing carrier | Shigeyuki Maruyama | 2003-11-11 |
| 6630839 | Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor | Shigeyuki Maruyama | 2003-10-07 |
| 6624645 | Semiconductor device testing method, using a spring-biased transformable conductive member electrode connection | Masaru Tateishi | 2003-09-23 |
| 6603325 | Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor | Shigeyuki Maruyama, Futoshi Fukaya | 2003-08-05 |
| 6555764 | Integrated circuit contactor, and method and apparatus for production of integrated circuit contactor | Shigeyuki Maruyama, Futoshi Fukaya, Susumu Moriya, Naomi Miyaji | 2003-04-29 |
| 6535002 | IC socket, a test method using the same and an IC socket mounting mechanism | Shigeyuki Maruyama, Masataka Mizukoshi, Futoshi Fukaya | 2003-03-18 |
| 6512386 | Device testing contactor, method of producing the same, and device testing carrier | Shigeyuki Maruyama | 2003-01-28 |
| 6466046 | Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor | Shigeyuki Maruyama, Futoshi Fukaya | 2002-10-15 |
| 6445200 | Semiconductor element testing carrier using a membrane contactor and a semiconductor element testing method and apparatus using such a carrier | — | 2002-09-03 |
| 6249135 | Method and apparatus for passive optical characterization of semiconductor substrates subjected to high energy (MEV) ion implantation using high-injection surface photovoltage | Shigeyuki Maruyama, Kazuhiro Tashiro, Futoshi Fukaya | 2001-06-19 |
| 6229320 | IC socket, a test method using the same and an IC socket mounting mechanism | Shigeyuki Maruyama, Masataka Mizukoshi, Futoshi Fukaya | 2001-05-08 |
| 6191604 | Integrated circuit testing device | Shigeyuki Maruyama, Naomi Miyaji, Susumu Moriya | 2001-02-20 |
| 6046598 | Test board and a test method using the same providing improved electrical connection | Naomi Miyaji, Susumu Moriya, Shigeyuki Maruyama, Futoshi Fukaya | 2000-04-04 |