KN

Kenichi Nagashige

Fujitsu Limited: 13 patents #2,362 of 24,456Top 10%
FL Fujitsu Semiconductor Limited: 2 patents #355 of 1,301Top 30%
FL Fujitsu Automation Limited: 1 patents #23 of 36Top 65%
FL Fujitsu Microelectronics Limited: 1 patents #212 of 624Top 35%
Overall (All Time): #299,405 of 4,157,543Top 8%
16
Patents All Time

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
8759119 Method of testing a semiconductor device and suctioning a semiconductor device in the wafer state Shigeyuki Maruyama, Yasuyuki Itoh, Tetsurou Honda, Kazuhiro Tashiro, Makoto Haseyama +2 more 2014-06-24
8404496 Method of testing a semiconductor device and suctioning a semiconductor device in the wafer state Shigeyuki Maruyama, Yasuyuki Itoh, Tetsurou Honda, Kazuhiro Tashiro, Makoto Haseyama +2 more 2013-03-26
7556985 Method of fabricating semiconductor device Norio Fukasawa, Hirohisa Matsuki, Yuzo Hamanaka, Muneharu Morioka 2009-07-07
7112889 Semiconductor device having an alignment mark formed by the same material with a metal post Shigeyuki Maruyama, Yasuyuki Itoh, Tetsurou Honda, Kazuhiro Tashiro, Makoto Haseyama +2 more 2006-09-26
7064047 Semiconductor device having a ball grid array and a fabrication process thereof Norio Fukasawa, Hirohisa Matsuki, Yuzo Hamanaka, Muneharu Morioka 2006-06-20
6987054 Method of fabricating a semiconductor device having a groove formed in a resin layer Norio Fukasawa, Hirohisa Matsuki, Yuzo Hamanaka, Muneharu Morioka 2006-01-17
6784542 Semiconductor device having a ball grid array and a fabrication process thereof Norio Fukasawa, Hirohisa Matsuki, Yuzo Hamanaka, Muneharu Morioka 2004-08-31
6774650 Probe card and method of testing wafer having a plurality of semiconductor devices Shigeyuki Maruyama, Daisuke Koizumi, Naoyuki Watanabe, Yoshito Konno, Eiji Yoshida +2 more 2004-08-10
6657282 Semiconductor device having a ball grid array and a fabrication process thereof Norio Fukasawa, Hirohisa Matsuki, Yuzo Hamanaka, Muneharu Morioka 2003-12-02
6563330 Probe card and method of testing wafer having a plurality of semiconductor devices Shigeyuki Maruyama, Daisuke Koizumi, Naoyuki Watanabe, Yoshito Konno, Eiji Yoshida +2 more 2003-05-13
6511620 Method of producing semiconductor devices having easy separability from a metal mold after molding Toshimi Kawahara, Hirohisa Matsuki, Yasuhiro Shinma, Yoshiyuki Yoneda, Norio Fukasawa +2 more 2003-01-28
6471501 Mold for fabricating semiconductor devices Yasuhiro Shinma, Muneharu Morioka, Norio Fukasawa, Yuzo Hamanaka, Tadashi Uno +1 more 2002-10-29
6469370 Semiconductor device and method of production of the semiconductor device Toshimi Kawahara, Hirohisa Matsuki, Yasuhiro Shinma, Yoshiyuki Yoneda, Norio Fukasawa +2 more 2002-10-22
6455920 Semiconductor device having a ball grid array and a fabrication process thereof Norio Fukasawa, Hirohisa Matsuki, Yuzo Hamanaka, Muneharu Morioka 2002-09-24
6437432 Semiconductor device having improved electrical characteristics and method of producing the same Masamitsu Ikumo, Toshimi Kawahara, Norio Fukasawa 2002-08-20
6218281 Semiconductor device with flip chip bonding pads and manufacture thereof Eiji Watanabe, Hirohisa Matsuki, Kenichi Kado, Masanori Onodera, Kunio Kodama +4 more 2001-04-17