Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8759119 | Method of testing a semiconductor device and suctioning a semiconductor device in the wafer state | Shigeyuki Maruyama, Yasuyuki Itoh, Kazuhiro Tashiro, Makoto Haseyama, Kenichi Nagashige +2 more | 2014-06-24 |
| 8404496 | Method of testing a semiconductor device and suctioning a semiconductor device in the wafer state | Shigeyuki Maruyama, Yasuyuki Itoh, Kazuhiro Tashiro, Makoto Haseyama, Kenichi Nagashige +2 more | 2013-03-26 |
| 7112889 | Semiconductor device having an alignment mark formed by the same material with a metal post | Shigeyuki Maruyama, Yasuyuki Itoh, Kazuhiro Tashiro, Makoto Haseyama, Kenichi Nagashige +2 more | 2006-09-26 |
| 7062346 | Method for manufacturing multi-kind and small quantity semiconductor products in a mass-production line and system thereof | Osamu Takagi, Tsuneo Iizuka, Takuya Honda | 2006-06-13 |
| 6862725 | Method for manufacturing multi-kind and small quantity semiconductor products in a mass-production line and system thereof | Osamu Takagi, Tsuneo Iizuka, Takuya Honda | 2005-03-01 |