Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7682140 | Mold for resin molding, resin molding apparatus, and semiconductor device manufacture method | Yoshitsugu Katoh | 2010-03-23 |
| 7646089 | Semiconductor package, method for manufacturing a semiconductor package, an electronic device, method for manufacturing an electronic device | Yuichi Asano, Yoshinori Niwa | 2010-01-12 |
| 7174629 | Integrated circuit contactor, and method and apparatus for production of integrated circuit contactor | Shigeyuki Maruyama, Makoto Haseyama, Susumu Moriya, Naomi Miyaji | 2007-02-13 |
| 6781395 | Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor | Shigeyuki Maruyama, Makoto Haseyama | 2004-08-24 |
| 6661247 | Semiconductor testing device | Shigeyuki Maruyama, Kazuhiro Tashiro, Makoto Haseyama | 2003-12-09 |
| 6603325 | Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor | Shigeyuki Maruyama, Makoto Haseyama | 2003-08-05 |
| 6555764 | Integrated circuit contactor, and method and apparatus for production of integrated circuit contactor | Shigeyuki Maruyama, Makoto Haseyama, Susumu Moriya, Naomi Miyaji | 2003-04-29 |
| 6535002 | IC socket, a test method using the same and an IC socket mounting mechanism | Makoto Haseyama, Shigeyuki Maruyama, Masataka Mizukoshi | 2003-03-18 |
| 6466046 | Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor | Shigeyuki Maruyama, Makoto Haseyama | 2002-10-15 |
| 6249135 | Method and apparatus for passive optical characterization of semiconductor substrates subjected to high energy (MEV) ion implantation using high-injection surface photovoltage | Shigeyuki Maruyama, Kazuhiro Tashiro, Makoto Haseyama | 2001-06-19 |
| 6229320 | IC socket, a test method using the same and an IC socket mounting mechanism | Makoto Haseyama, Shigeyuki Maruyama, Masataka Mizukoshi | 2001-05-08 |
| 6046598 | Test board and a test method using the same providing improved electrical connection | Naomi Miyaji, Susumu Moriya, Shigeyuki Maruyama, Makoto Haseyama | 2000-04-04 |
| 5986459 | Semiconductor device testing carrier and method of fixing semiconductor device to testing carrier | Shigeyuki Maruyama | 1999-11-16 |