Issued Patents All Time
Showing 51–69 of 69 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6563330 | Probe card and method of testing wafer having a plurality of semiconductor devices | Daisuke Koizumi, Naoyuki Watanabe, Yoshito Konno, Eiji Yoshida, Toshiyuki Honda +2 more | 2003-05-13 |
| 6555764 | Integrated circuit contactor, and method and apparatus for production of integrated circuit contactor | Makoto Haseyama, Futoshi Fukaya, Susumu Moriya, Naomi Miyaji | 2003-04-29 |
| 6545363 | Contactor having conductive particles in a hole as a contact electrode | Susumu Kida, Naoyuki Watanabe, Takafumi Hashitani, Ei Yano, Ichiro Midorikawa | 2003-04-08 |
| 6535002 | IC socket, a test method using the same and an IC socket mounting mechanism | Makoto Haseyama, Masataka Mizukoshi, Futoshi Fukaya | 2003-03-18 |
| 6512386 | Device testing contactor, method of producing the same, and device testing carrier | Makoto Haseyama | 2003-01-28 |
| 6472744 | Semiconductor module including a plurality of semiconductor devices detachably | Mitsutaka Sato, Tetsuya Fujisawa, Junichi Kasai, Toshimi Kawahara, Toshio Hamano +5 more | 2002-10-29 |
| 6466046 | Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor | Futoshi Fukaya, Makoto Haseyama | 2002-10-15 |
| 6433563 | Probe card with rigid base having apertures for testing semiconductor device, and semiconductor device test method using probe card | — | 2002-08-13 |
| 6410354 | Semiconductor substrate test device and method | Naoyuki Watanabe, Daisuke Koizumi, Akira Sawamori | 2002-06-25 |
| 6249135 | Method and apparatus for passive optical characterization of semiconductor substrates subjected to high energy (MEV) ion implantation using high-injection surface photovoltage | Kazuhiro Tashiro, Makoto Haseyama, Futoshi Fukaya | 2001-06-19 |
| 6229320 | IC socket, a test method using the same and an IC socket mounting mechanism | Makoto Haseyama, Masataka Mizukoshi, Futoshi Fukaya | 2001-05-08 |
| 6228684 | Wafer-level package, a method of manufacturing thereof and a method of manufacturing semiconductor devices from such a wafer-level package | — | 2001-05-08 |
| 6191604 | Integrated circuit testing device | Makoto Haseyama, Naomi Miyaji, Susumu Moriya | 2001-02-20 |
| 6046598 | Test board and a test method using the same providing improved electrical connection | Naomi Miyaji, Susumu Moriya, Makoto Haseyama, Futoshi Fukaya | 2000-04-04 |
| 5986459 | Semiconductor device testing carrier and method of fixing semiconductor device to testing carrier | Futoshi Fukaya | 1999-11-16 |
| 5828224 | Test carrier for semiconductor integrated circuit and method of testing semiconductor integrated circuit | — | 1998-10-27 |
| 5757199 | Test carrier for semiconductor integrated circuit and method of testing semiconductor integrated circuit | — | 1998-05-26 |
| 5534785 | Integrated circuit bare chip carrier | Tsutomu Yoshizaki, Tsuyoshi Ohno | 1996-07-09 |
| 4604572 | Device for testing semiconductor devices at a high temperature | Akinori Horiuchi, Toshio Binnaka | 1986-08-05 |