Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6972586 | Panel inspection apparatus | — | 2005-12-06 |
| 6410354 | Semiconductor substrate test device and method | Shigeyuki Maruyama, Naoyuki Watanabe, Daisuke Koizumi | 2002-06-25 |
AS
Akira Sawamori
Overall (All Time): #2,185,260 of 4,157,543Top 55%
2
Patents All Time