Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8648617 | Semiconductor device and method of testing semiconductor device | Yuji Maruyama, Tatsuhiro Mizumasa, Shigeru Gotoh, Takayuki Yano, Susumu Koshinuma +2 more | 2014-02-11 |
| 8159250 | Testing device for testing a semiconductor device | Yuji Maruyama, Kazuhiro Tashiro, Kazuhiko Shimabayashi, Shigeru Goto, Susumu Koshinuma +1 more | 2012-04-17 |