Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8754667 | Semiconductor device test method and semiconductor device | Chiaki Mimura | 2014-06-17 |
| 8159250 | Testing device for testing a semiconductor device | Yuji Maruyama, Kazuhiro Tashiro, Shigeru Goto, Takayuki Nakashiro, Susumu Koshinuma +1 more | 2012-04-17 |
| 7495464 | Inspection device of a semiconductor device | Mitsuo Miyazaki | 2009-02-24 |