Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7915720 | Semiconductor integrated circuit device and test method thereof | Kazuhiro Tashiro | 2011-03-29 |
| 7199600 | Semiconductor device testing method and testing equipment | Kazuhiro Tashiro | 2007-04-03 |
| 6462574 | Burn-in system, burn-in control technique, and semiconductor device production method using said system and technique | Hiroyuki Yoshioka, Toshiaki Tominaga | 2002-10-08 |