YE

Yoshihiko Endou

FL Fujitsu Microelectronics Limited: 1 patents #212 of 624Top 35%
Overall (All Time): #3,276,611 of 4,157,543Top 80%
1
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7649370 Evaluation method of probe mark of probe needle of probe card using imaginary electrode pad and designated determination frame Yoshikazu Arisaka, Tatsuya Miyazaki 2010-01-19