Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7256591 | Probe card, having cantilever-type probe and method | Tsutomu Tatematsu, Kenji Togashi, Tetsuhiro Nanbu, Shigenobu Ishihara, Yoshikazu Arisaka +2 more | 2007-08-14 |
| 7171592 | Self-testing circuit in semiconductor memory device | Kenji Togashi, Shigekazu Aoki, Katsumi Shigenobu, Yukio Saka, Yoshikazu Arisaka +2 more | 2007-01-30 |
| 6765401 | Semiconductor testing apparatus for conducting conduction tests | — | 2004-07-20 |