SS

Stefan Cornelis Theodorus Van Der Sanden

AB Asml Netherlands B.V.: 12 patents #377 of 3,192Top 15%
📍 Nijmegen, NL: #36 of 900 inventorsTop 4%
Overall (All Time): #406,400 of 4,157,543Top 10%
12
Patents All Time

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
11782349 Methods of determining corrections for a patterning process, device manufacturing method, control system for a lithographic apparatus and lithographic apparatus Weitian Kou, Alexander Ypma, Marc Hauptmann, Michiel Kupers, Lydia Marianna Vergaij-Huizer +8 more 2023-10-10
11592753 Methods of determining corrections for a patterning process, device manufacturing method, control system for a lithographic apparatus and lithographic apparatus Weitian Kou, Alexander Ypma, Marc Hauptmann, Michiel Kupers, Lydia Marianna Vergaij-Huizer +8 more 2023-02-28
11493851 Lithographic method and lithographic apparatus Hakki Ergün Cekli, Xing Lan Liu, Richard Johannes Franciscus Van Haren 2022-11-08
11327407 Methods of determining corrections for a patterning process, device manufacturing method, control system for a lithographic apparatus and lithographic apparatus Weitian Kou, Alexander Ypma, Marc Hauptmann, Michiel Kupers, Lydia Marianna Vergaij-Huizer +8 more 2022-05-10
11156923 Lithographic method and lithographic apparatus Hakki Ergün Cekli, Xing Lan Liu, Richard Johannes Franciscus Van Haren 2021-10-26
11003099 Method and apparatus for design of a metrology target Maurits Van Der Schaar, Murat Bozkurt, Patrick Warnaar 2021-05-11
10877381 Methods of determining corrections for a patterning process Weitian Kou, Alexander Ypma, Marc Hauptmann, Michiel Kupers, Lydia Marianna Vergaij-Huizer +8 more 2020-12-29
10437163 Method and apparatus for design of a metrology target Maurits Van Der Schaar, Murat Bozkurt, Patrick Warnaar 2019-10-08
10025193 Lithographic apparatus, device manufacturing method and associated data processing apparatus and computer program product Hakki Ergün Cekli, Xing Lan Liu, Daan Maurits Slotboom, Wim Tjibbo Tel, Richard Johannes Franciscus Van Haren 2018-07-17
9753377 Deformation pattern recognition method, pattern transferring method, processing device monitoring method, and lithographic apparatus Hakki Ergün Cekli, Irina Lyulina, Manfred Gawein Tenner, Richard Johannes Franciscus Van Haren 2017-09-05
9291916 Method of applying a pattern to a substrate, device manufacturing method and lithographic apparatus for use in such methods Richard Johannes Franciscus Van Haren, Hubertus Johannes Gertrudus Simons, Remi Daniel Marie Edart, Xiuhong Wei, Irina Lyulina +1 more 2016-03-22
8976355 Method of applying a pattern to a substrate, device manufacturing method and lithographic apparatus for use in such methods Richard Johannes Franciscus Van Haren, Hubertus Johannes Gertrudus Simons, Remi Daniel Marie Edart, Xiuhong Wei, Michael Kubis +1 more 2015-03-10