Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9431503 | Integrating transistors with different poly-silicon heights on the same die | Chuan Lin, Hidehiko Shiraiwa, Lei Xue, Simon S. Chan, Kenichi Ohtsuka +2 more | 2016-08-30 |
| 9196624 | Leakage reducing writeline charge protection circuit | Mark Randolph, Sung-Yong Chung, Hidehiko Shiraiwa | 2015-11-24 |
| 8809206 | Patterned dummy wafers loading in batch type CVD | Rinji Sugino, Lei Xue, Kenichi Ohtsuka | 2014-08-19 |
| 8652907 | Integrating transistors with different poly-silicon heights on the same die | Chuan Lin, Hidehiko Shiraiwa, Lei Xue, Simon S. Chan, Kenichi Ohtsuka +2 more | 2014-02-18 |
| 8409994 | Gate trim process using either wet etch or dry etch approach to target CD for selected transistors | Jihwan P. Choi, Angela T. Hui | 2013-04-02 |
| 8067314 | Gate trim process using either wet etch or dry etch approach to target CD for selected transistors | Jihwan P. Choi, Angela T. Hui | 2011-11-29 |
| 7553727 | Using implanted poly-1 to improve charging protection in dual-poly process | Ming Sang Kwan, Jean Y. Yang, Zhizheng Liu, Yi He | 2009-06-30 |
| 6684122 | Control mechanism for matching process parameters in a multi-chamber process tool | Craig W. Christian, Allen L. Evans | 2004-01-27 |
| 6512991 | Method and apparatus for reducing deposition variation by modeling post-clean chamber performance | Allen L. Evans, Craig W. Christian | 2003-01-28 |
| 6492281 | Method of fabricating conductor structures with metal comb bridging avoidance | Shengnian Song, Sey-Ping Sun | 2002-12-10 |
| 6469518 | Method and apparatus for determining measurement frequency based on hardware age and usage | Allen L. Evans, Craig W. Christian | 2002-10-22 |
| 6403151 | Method for controlling optical properties of antireflective coatings | Craig W. Christian, Allen L. Evans | 2002-06-11 |
| 6257760 | Using a superlattice to determine the temperature of a semiconductor fabrication process | Shengnian Song, Sey-Ping Sun | 2001-07-10 |
| 6022749 | Using a superlattice to determine the temperature of a semiconductor fabrication process | Shengnian Song, Sey-Ping Sun | 2000-02-08 |