Issued Patents All Time
Showing 1–25 of 43 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11988497 | Optical unit and film thickness measurement device | Ikuo Arata, Satoshi Takimoto | 2024-05-21 |
| 11280604 | Film thickness measurement device, film thickness measurement method, film thickness measurement program, and recording medium for recording film thickness measurement program | — | 2022-03-22 |
| 10256137 | Self-aligned trench isolation in integrated circuits | Ching-Huang Lu, Lei Xue, Simon S. Chan, Rinji Sugino | 2019-04-09 |
| 10062758 | Semiconductor device | Naruhisa Miura, Shuhei Nakata, Shoyu Watanabe, Hiroshi Watanabe | 2018-08-28 |
| 9846028 | Film thickness measurement method and film thickness measurement device | Tetsuhisa Nakano | 2017-12-19 |
| 9831114 | Self-aligned trench isolation in integrated circuits | Ching-Huang Lu, Lei Xue, Rinji Sugino, Simon S. Chan | 2017-11-28 |
| 9502553 | Semiconductor device and method for manufacturing the same | Naruhisa Miura, Shuhei Nakata, Shoyu Watanabe, Naoki Yutani | 2016-11-22 |
| 9437470 | Self-aligned trench isolation in integrated circuits | Ching-Huang Lu, Lei Xue, Simon S. Chan, Rinji Sugino | 2016-09-06 |
| 9431503 | Integrating transistors with different poly-silicon heights on the same die | Chuan Lin, Hidehiko Shiraiwa, Bradley Marc Davis, Lei Xue, Simon S. Chan +2 more | 2016-08-30 |
| 9324782 | Semiconductor device | Naruhisa Miura, Shiro Hino | 2016-04-26 |
| 9293572 | Power semiconductor device | Akihiko Furukawa, Yasuhiro Kagawa, Naruhisa Miura, Shiro Hino, Shuhei Nakata +2 more | 2016-03-22 |
| 9190468 | Semiconductor device | Shiro Hino, Naruhisa Miura, Akihiko Furukawa, Tomokatsu Watanabe, Hiroshi Watanabe +1 more | 2015-11-17 |
| 9153443 | Semiconductor device and method of fabricating same | Hiroshi Watanabe | 2015-10-06 |
| 9105715 | Semiconductor device and method for manufacturing the same | Naruhisa Miura, Shuhei Nakata, Shoyu Watanabe, Naoki Yutani | 2015-08-11 |
| 9059193 | Epitaxial wafer and semiconductor element | Kenichi Kuroda, Hiroshi Watanabe, Naoki Yutani, Hiroaki Sumitani | 2015-06-16 |
| 9006819 | Power semiconductor device and method for manufacturing same | Shiro Hino, Naruhisa Miura, Shuhei Nakata, Shoyu Watanabe, Akihiko Furukawa +2 more | 2015-04-14 |
| 8963276 | Semiconductor device including a cell array having first cells and second cells interspersed around the arrangement of the first cells | Hiroshi Watanabe, Naoki Yutani, Yoshiyuki Nakaki | 2015-02-24 |
| 8916880 | Silicon carbide epitaxial wafer and semiconductor device | Nobuyuki Tomita, Tomoaki Furusho | 2014-12-23 |
| 8885173 | Film thickness measurement device and film thickness measurement method | Tetsuhisa Nakano, Motoyuki Watanabe | 2014-11-11 |
| 8860039 | Semiconductor device | Naruhisa Miura, Shuhei Nakata, Shoyu Watanabe, Hiroshi Watanabe | 2014-10-14 |
| 8809206 | Patterned dummy wafers loading in batch type CVD | Rinji Sugino, Bradley Marc Davis, Lei Xue | 2014-08-19 |
| 8699023 | Reflectivity measuring device, reflectivity measuring method, membrane thickness measuring device, and membrane thickness measuring method | Tetsuhisa Nakano | 2014-04-15 |
| 8679952 | Method of manufacturing silicon carbide epitaxial wafer | Nobuyuki Tomita, Kenichi Hamano, Masayoshi Tarutani, Yoichiro Mitani, Takeharu Kuroiwa +5 more | 2014-03-25 |
| 8680538 | Silicon carbide semiconductor device | Yoichiro Tarui, Naruhisa Miura, Yoshinori Matsuno, Masayuki Imaizumi | 2014-03-25 |
| 8652907 | Integrating transistors with different poly-silicon heights on the same die | Chuan Lin, Hidehiko Shiraiwa, Bradley Marc Davis, Lei Xue, Simon S. Chan +2 more | 2014-02-18 |