Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9846028 | Film thickness measurement method and film thickness measurement device | Kenichi Ohtsuka | 2017-12-19 |
| 8885173 | Film thickness measurement device and film thickness measurement method | Kenichi Ohtsuka, Motoyuki Watanabe | 2014-11-11 |
| 8699023 | Reflectivity measuring device, reflectivity measuring method, membrane thickness measuring device, and membrane thickness measuring method | Kenichi Ohtsuka | 2014-04-15 |
| 8649023 | Film thickness measurement device and measurement method | Kenichi Ohtsuka, Motoyuki Watanabe | 2014-02-11 |