Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8885173 | Film thickness measurement device and film thickness measurement method | Kenichi Ohtsuka, Tetsuhisa Nakano | 2014-11-11 |
| 8649023 | Film thickness measurement device and measurement method | Kenichi Ohtsuka, Tetsuhisa Nakano | 2014-02-11 |
| 8462337 | Spectrometer, spectrometry, and spectrometry program | Kazuya Iguchi, Kengo Suzuki | 2013-06-11 |
| 7400396 | Fluorescent correalated spectrometric analysis device | Hirohiko Watanabe, Takayuki Inoue, Tadashi Maruno, Fumio Iwase | 2008-07-15 |
| 6897964 | Thickness measuring apparatus, thickness measuring method, and wet etching apparatus and wet etching method utilizing them | Teruo Takahashi, Hidenori Takahashi | 2005-05-24 |
| 6897953 | Method for measuring fluorescence, apparatus for measuring fluorescence and apparatus for evaluating sample using it | Kazuya Iguchi | 2005-05-24 |
| 6768552 | Thickness measuring apparatus, thickness measuring method, and wet etching apparatus and wet etching method utilizing them | Teruo Takahashi | 2004-07-27 |
| 5250795 | Feeble light measuring device | Musubu Koishi | 1993-10-05 |
| 5017829 | Framing camera | Musubu Koishi | 1991-05-21 |
| 4945224 | Optical waveform observing apparatus | Musubu Koishi, Etsuo Tsujimura, Yutaka Tsuchiya | 1990-07-31 |