Issued Patents All Time
Showing 1–25 of 50 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9171936 | Barrier region underlying source/drain regions for dual-bit memory devices | Shankar Sinha, Yi He, Ming Sang Kwan | 2015-10-27 |
| 9153596 | Adjacent wordline disturb reduction using boron/indium implant | Gulzar Kathawala, Kuo-Tung Chang, Lei Xue | 2015-10-06 |
| 9142311 | Screening for reference cells in a memory | Cindy Sun, He Yi, Gulzar Kathawala | 2015-09-22 |
| 8995198 | Multi-pass soft programming | Gulzar Kathawala, Mark Randolph, Yi He, Tio Wei Neo, Cindy Sun +5 more | 2015-03-31 |
| 8559255 | Controlling AC disturbance while programming | Sung-Yong Chung, Yugi Mizuguchi, Xuguang Wang, Yi He, Ming Sang Kwan +4 more | 2013-10-15 |
| 8404541 | Strapping contact for charge protection | Wei Zheng, Jean Y. Yang, Mark Randolph, Ming Sang Kwan, Yi He +1 more | 2013-03-26 |
| 8264165 | Method and system for dimming an offline LED driver | Wei Gu | 2012-09-11 |
| 8264898 | Controlling AC disturbance while programming | Sung-Yong Chung, Yugi Mizuguchi, Xuguang Wang, Yi He, Ming Sang Kwan +4 more | 2012-09-11 |
| 8203178 | System and method for reducing process-induced charging | Ashot Melik Martirosian, Mark Randolph | 2012-06-19 |
| 7995386 | Applying negative gate voltage to wordlines adjacent to wordline associated with read or verify to reduce adjacent wordline disturb | Yuji Mizuguchi, Mark Randolph, Darlene Hamilton, Yi He, Yanxia Lin +9 more | 2011-08-09 |
| 7986562 | Controlling AC disturbance while programming | Sung-Yong Chung, Yugi Mizuguchi, Xuguang Wang, Yi He, Ming Sang Kwan +4 more | 2011-07-26 |
| 7977218 | Thin oxide dummy tiling as charge protection | Cinti X. Chen, Yi He, Wenmei Li, Ming Sang Kwan, Yu Sun +1 more | 2011-07-12 |
| 7952938 | Selective application of word line bias to minimize fringe effects in electromagnetic fields during erase of nonvolatile memory | Gulzar Kathawala, Wei Zheng, Sung-Yong Chung, Timothy Thurgate, Kuo-Tung Chang +2 more | 2011-05-31 |
| 7944746 | Room temperature drift suppression via soft program after erase | Gwyn Robert Jones, Mark Randolph, John Anthony Darilek, Sean Michael O'Mullan, Jacob Marcantel +7 more | 2011-05-17 |
| 7888218 | Using thick spacer for bitline implant then remove | Shankar Sinha, Timothy Thurgate, Ming Sang Kwan | 2011-02-15 |
| 7804125 | System and method for reducing process-induced charging | Ashot Melik Martirosian, Mark Randolph | 2010-09-28 |
| 7750407 | Strapping contact for charge protection | Wei Zheng, Jean Y. Yang, Mark Randolph, Ming Sang Kwan, Yi He +1 more | 2010-07-06 |
| 7746698 | Programming in memory devices using source bitline voltage bias | An-Chung Chen, Wei Zheng, Kuo-Tung Chang, Sung-Yong Chung, Gulzar Ahmed Kathawala +1 more | 2010-06-29 |
| 7746705 | Selective application of word line bias to minimize fringe effects in electromagnetic fields during erase of nonvolatile memory | Gulzar Ahmed Kathawala, Wei Zheng, Sung-Yong Chung, Timothy Thurgate, Kuo-Tung Chang +2 more | 2010-06-29 |
| 7679967 | Controlling AC disturbance while programming | Sung-Yong Chung, Yugi Mizuguchi, Xuguang Wang, Yi He, Ming Sang Kwan +4 more | 2010-03-16 |
| 7671405 | Deep bitline implant to avoid program disturb | Timothy Thurgate, Yi He, Ming Sang Kwan, Xuguang Wang | 2010-03-02 |
| 7626869 | Multi-phase wordline erasing for flash memory | Xuguang Wang, Yi He, Sung-Yong Chung, Darlene Hamilton, Ashot Melik-Martirosian +4 more | 2009-12-01 |
| 7619932 | Algorithm for charge loss reduction and Vt distribution improvement | Gwyn Robert Jones, Edward Franklin Runnion, Mark Randolph | 2009-11-17 |
| 7573103 | Back-to-back NPN/PNP protection diodes | Yi He, Meng Ding, Wei Zheng | 2009-08-11 |
| 7561457 | Select transistor using buried bit line from core | Mark Randolph, Ashot Melik-Martirosian, Yi He, Shankar Sinha | 2009-07-14 |