KC

Kangguo Cheng

IBM: 64 patents #4 of 7,845Top 1%
TE Tessera: 6 patents #1 of 56Top 2%
📍 Schenectady, NY: #1 of 118 inventorsTop 1%
🗺 New York: #2 of 12,227 inventorsTop 1%
Overall (2022): #129 of 548,613Top 1%
70
Patents 2022

Issued Patents 2022

Showing 26–50 of 70 patents

Patent #TitleCo-InventorsDate
11380589 Selective removal of semiconductor fins Veeraraghavan S. Basker, Ali Khakifirooz 2022-07-05
11380842 Phase change memory cell with second conductive layer Juntao Li, Ruilong Xie, Junli Wang 2022-07-05
11380778 Vertical fin field effect transistor devices with self-aligned source and drain junctions Juntao Li, Choonghyun Lee, Shogo Mochizuki 2022-07-05
11378545 Nanofluid sensor with real-time spatial sensing Ali Khakifirooz, Ghavam G. Shahidi, Davood Shahrjerdi 2022-07-05
11362093 Co-integration of non-volatile memory on gate-all-around field effect transistor Zhenxing Bi, Zheng Xu, Dexin Kong 2022-06-14
11362194 Transistor having confined source/drain regions with wrap-around source/drain contacts Alexander Reznicek, Ruilong Xie, Marc A. Bergendahl 2022-06-14
11362193 Inverse T-shaped contact structures having air gap spacers Choonghyun Lee, Juntao Li, Heng Wu, Peng Xu 2022-06-14
11361928 Piezoelectric vacuum transistor Qing Cao, Zhengwen Li, Fei Liu 2022-06-14
11355644 Vertical field effect transistors with self aligned contacts Yi Song, Juntao Li 2022-06-07
11355588 Strained and unstrained semiconductor device features formed on the same substrate Juntao Li, Peng Xu 2022-06-07
11355649 Nanosheet transistor having abrupt junctions between the channel nanosheets and the source/drain extension regions Choonghyun Lee, Juntao Li, Shogo Mochizuki 2022-06-07
11349001 Replacement gate cross-couple for static random-access memory scaling Ruilong Xie, Carl Radens, Veeraraghavan S. Basker, Juntao Li 2022-05-31
11342230 Homogeneous densification of fill layers for controlled reveal of vertical fins Choonghyun Lee, Juntao Li, Heng Wu, Peng Xu 2022-05-24
11335773 Trench contact resistance reduction Zhenxing Bi, Juntao Li, Peng Xu 2022-05-17
11329143 Nanosheet transistors with thin inner spacers and tight pitch gate Choonghyun Lee, Juntao Li, Peng Xu 2022-05-10
11329001 Embedded chip identification formed by directed self-assembly Chi-Chun Liu 2022-05-10
11322402 Self-aligned top via scheme Ruilong Xie, Chih-Chao Yang, Carl Radens, Juntao Li 2022-05-03
11322588 Contact source/drain resistance Fee Li Lie, Choonghyun Lee, Hemanth Jagannathan, Oleg Gluschenkov 2022-05-03
11315836 Two-dimensional vertical fins 2022-04-26
11316015 Silicon germanium FinFET with low gate induced drain leakage current Shogo Mochizuki, Choonghyun Lee, Juntao Li 2022-04-26
11315799 Back end of line structures with metal lines with alternating patterning and metallization schemes Ruilong Xie, Chanro Park, Chih-Chao Yang, Juntao Li 2022-04-26
11309397 Contact over active gate employing a stacked spacer 2022-04-19
11302799 Method and structure for forming a vertical field-effect transistor Peng Xu, Choonghyun Lee, Juntao Li 2022-04-12
11296226 Transistor having wrap-around source/drain contacts and under-contact spacers Yi Song, Praveen Joseph, Andrew M. Greene 2022-04-05
11295985 Forming a backside ground or power plane in a stacked vertical transport field effect transistor Chen Zhang, Tenko Yamashita, Lawrence A. Clevenger 2022-04-05