HS

Harmeet Singh

Lam Research: 12 patents #5 of 444Top 2%
AB Asml Netherlands B.V.: 1 patents #281 of 721Top 40%
📍 Kanchinakote, CA: #3 of 100 inventorsTop 3%
Overall (2019): #5,237 of 560,194Top 1%
13
Patents 2019

Issued Patents 2019

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
10515816 Integrating atomic scale processes: ALD (atomic layer deposition) and ALE (atomic layer etch) Keren Jacobs Kanarik, Jeffrey Marks, Samantha Tan, Alexander Kabansky, Wenbing Yang +3 more 2019-12-24
10497544 Component of a plasma processing apparatus having a protective in situ formed layer on a plasma exposed surface Thorsten Lill 2019-12-03
10424461 Controlling ion energy within a plasma chamber Thorsten Lill, Alex Paterson, Gowri Kamarthy 2019-09-24
10403475 Tunable multi-zone gas injection system David Cooperberg, Vahid Vahedi, Douglas Ratto, Neil Benjamin 2019-09-03
10388493 Component of a substrate support assembly producing localized magnetic fields Keith Gaff, Brett C. Richardson, Sung Lee 2019-08-20
10372045 Method of calibrating a reluctance actuator assembly, reluctance actuator and lithographic apparatus comprising such reluctance actuator Johannes Antonius Gerardus Akkermans, Bas Pieter Lemmen, Sjoerd Martijn Huiberts, Joeri Lof, Petrus Theodorus Rutgers +2 more 2019-08-06
10256077 Sub-pulsing during a state John C. Valcore, Jr., Bradford J. Lyndaker 2019-04-09
10242883 High aspect ratio etch of oxide metal oxide metal stack Joydeep Guha, Sirish Reddy, Kaushik Chattopadhyay, Thomas W. Mountsier, Aaron Eppler +2 more 2019-03-26
10236193 Substrate supports with multi-layer structure including independent operated heater zones Keith Gaff, Neil Benjamin, Keith Comendant 2019-03-19
10224221 Internal plasma grid for semiconductor fabrication Thorsten Lill, Vahid Vahedi, Alex Paterson, Monica Titus, Gowri Kamarthy 2019-03-05
10217615 Plasma processing apparatus and component thereof including an optical fiber for determining a temperature thereof 2019-02-26
10197908 Photoresist design layout pattern proximity correction through fast edge placement error prediction via a physics-based etch profile modeling framework Saravanapriyan Sriraman, Richard Wise, Alex Paterson, Andrew D. Bailey, III, Vahid Vahedi +1 more 2019-02-05
10186426 Integrating atomic scale processes: ALD (atomic layer deposition) and ale (atomic layer etch) Keren Jacobs Kanarik, Jeffrey Marks, Samantha Tan, Alexander Kabansky, Wenbing Yang +3 more 2019-01-22