Issued Patents 2011
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8045149 | Apparatus for detecting defects using multiple coordinate systems | Minoru Yoshida | 2011-10-25 |
| 8005292 | Method and apparatus for inspecting pattern defects | Kaoru Sakai, Takafumi Okabe | 2011-08-23 |
| 8004666 | Apparatus for inspecting defects | Yukihiro Shibata | 2011-08-23 |
| 7987033 | Method for determining the morphology of an occupant in an automotive seat with capacitive sensors | Claude Launay, Joaquim Da Silva, Florent Voisin, Tomoaki Hirai, Takanori Ninomiya | 2011-07-26 |
| 7973920 | Apparatus and method for inspecting defects | Hiroyuki Nakano, Akira Hamamatsu, Sachio Uto, Yoshimasa Oshima, Hidetoshi Nishiyama +1 more | 2011-07-05 |
| 7962311 | Method using capacitive sensors for morphology discrimination of a passenger seating in an automotive seat | Claude Launay, Tomoaki Hirai, Joaquim Da Silva, Florent Voisin, Takanori Ninomiya | 2011-06-14 |
| 7952699 | Apparatus of inspecting defect in semiconductor and method of the same | Akira Hamamatsu, Hisae Shibuya | 2011-05-31 |
| 7952074 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2011-05-31 |
| 7949178 | Pattern inspection method and its apparatus | Kaoru Sakai, Takafumi Okabe | 2011-05-24 |
| 7940385 | Defect inspection apparatus and its method | Akira Hamamatsu, Hisae Shibuya | 2011-05-10 |
| 7916929 | Defect inspection method and apparatus | Kenji Oka, Yukihiro Shibata, Minoru Yoshida, Chie Shishido, Yuji Takagi +2 more | 2011-03-29 |
| 7903249 | Method and apparatus for inspecting pattern defects | Minoru Yoshida, Atsushi Shimoda, Kaoru Sakai, Takafumi Okabe | 2011-03-08 |
| 7895014 | Method for improving the localisation of a target in regard of a sensor | Claude Launay, Joaquim Da Silva, Florent Voisin, Tomoaki Hirai, Takanori Ninomiya | 2011-02-22 |
| 7869966 | Inspection method and its apparatus, inspection system | Takafumi Okabe, Kaoru Sakai | 2011-01-11 |