Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8004666 | Apparatus for inspecting defects | Shunji Maeda | 2011-08-23 |
| 7916929 | Defect inspection method and apparatus | Shunji Maeda, Kenji Oka, Minoru Yoshida, Chie Shishido, Yuji Takagi +2 more | 2011-03-29 |