Issued Patents 2011
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8086422 | Method for analyzing defect data and inspection apparatus and review system | Hisae Shibuya | 2011-12-27 |
| 8027527 | Method for analyzing defect data and inspection apparatus and review system | Hisae Shibuya | 2011-09-27 |
| 7934890 | End mill | Seiichiro Kitaura | 2011-05-03 |
| 7916929 | Defect inspection method and apparatus | Shunji Maeda, Kenji Oka, Yukihiro Shibata, Minoru Yoshida, Chie Shishido +2 more | 2011-03-29 |
| 7912276 | Method and apparatus for detecting pattern defects | Hisae Shibuya, Akira Hamamatsu | 2011-03-22 |
| 7873205 | Apparatus and method for classifying defects using multiple classification modules | Hirohito Okuda, Toshifumi Honda, Atsushi Miyamoto, Takehiro Hirai | 2011-01-18 |