Issued Patents 2011
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7991217 | Defect classifier using classification recipe based on connection between rule-based and example-based classifiers | Ryo Nakagaki, Masaki Kurihara | 2011-08-02 |
| 7903867 | Method and apparatus for displaying detected defects | Kenji Nakahira | 2011-03-08 |
| 7873202 | Method and apparatus for reviewing defects of semiconductor device | Masaki Kurihara, Ryo Nakagaki | 2011-01-18 |
| 7873205 | Apparatus and method for classifying defects using multiple classification modules | Hirohito Okuda, Yuji Takagi, Atsushi Miyamoto, Takehiro Hirai | 2011-01-18 |