Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7991217 | Defect classifier using classification recipe based on connection between rule-based and example-based classifiers | Masaki Kurihara, Toshifumi Honda | 2011-08-02 |
| 7932493 | Method and system for observing a specimen using a scanning electron microscope | Minoru Harada, Kenji Obara | 2011-04-26 |
| 7873202 | Method and apparatus for reviewing defects of semiconductor device | Masaki Kurihara, Toshifumi Honda | 2011-01-18 |