Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7991217 | Defect classifier using classification recipe based on connection between rule-based and example-based classifiers | Ryo Nakagaki, Toshifumi Honda | 2011-08-02 |
| 7945873 | Mask pattern data generating method, information processing apparatus, photomask fabrication system, and image sensing apparatus | Kyouhei Watanabe, Hitoshi Shindo, Nobuhiko Sato, Yasuhiro Sekine, Masataka Ito | 2011-05-17 |
| 7873202 | Method and apparatus for reviewing defects of semiconductor device | Toshifumi Honda, Ryo Nakagaki | 2011-01-18 |