Issued Patents 2011
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8013299 | Review method and review device | Takehiro Hirai, Kohei Yamaguchi, Naoma Ban | 2011-09-06 |
| 7932493 | Method and system for observing a specimen using a scanning electron microscope | Minoru Harada, Ryo Nakagaki | 2011-04-26 |
| 7925367 | Defect review and classification system | Takehiro Hirai, Kazuo Aoki | 2011-04-12 |
| 7881558 | Scanning microscope | Kohei Yamaguchi, Kazuo Aoki | 2011-02-01 |
| 7866746 | Structure of attaching monitor panel | Toyotaka Watanabe, Takayuki Niwa, Nobuhiko Kazui, Masahiro Iwamoto, Satoshi Sugiyama +3 more | 2011-01-11 |
| 7869969 | Defect review apparatus and method of reviewing defects | Takehiro Hirai, Kohei Yamaguchi | 2011-01-11 |