Issued Patents 2011
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8036845 | Method of correcting coordinates, and defect review apparatus | Kazuo Aoki, Kumi Kaneko | 2011-10-11 |
| 8013299 | Review method and review device | Kenji Obara, Kohei Yamaguchi, Naoma Ban | 2011-09-06 |
| 7925367 | Defect review and classification system | Kazuo Aoki, Kenji Obara | 2011-04-12 |
| 7873205 | Apparatus and method for classifying defects using multiple classification modules | Hirohito Okuda, Yuji Takagi, Toshifumi Honda, Atsushi Miyamoto | 2011-01-18 |
| 7869969 | Defect review apparatus and method of reviewing defects | Kenji Obara, Kohei Yamaguchi | 2011-01-11 |