Issued Patents 2011
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8035808 | Surface defect inspection method and apparatus | Toshiyuki Nakao, Shigeru Matsui | 2011-10-11 |
| 7973920 | Apparatus and method for inspecting defects | Hiroyuki Nakano, Akira Hamamatsu, Sachio Uto, Hidetoshi Nishiyama, Yuta Urano +1 more | 2011-07-05 |
| 7970199 | Method and apparatus for detecting defect on a surface of a specimen | Minoru Yoshida | 2011-06-28 |
| 7965386 | Method and its apparatus for inspecting defects | Yuta Urano, Toshiyuki Nakao | 2011-06-21 |
| 7916288 | Defect inspection method | Toshiyuki Nakao, Yuta Urano | 2011-03-29 |
| 7869024 | Method and its apparatus for inspecting defects | Yuta Urano, Toshiyuki Nakao | 2011-01-11 |