Issued Patents 2011
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7973920 | Apparatus and method for inspecting defects | Hiroyuki Nakano, Akira Hamamatsu, Sachio Uto, Yoshimasa Oshima, Hidetoshi Nishiyama +1 more | 2011-07-05 |
| 7965386 | Method and its apparatus for inspecting defects | Toshiyuki Nakao, Yoshimasa Oshima | 2011-06-21 |
| 7916288 | Defect inspection method | Toshiyuki Nakao, Yoshimasa Oshima | 2011-03-29 |
| 7869024 | Method and its apparatus for inspecting defects | Toshiyuki Nakao, Yoshimasa Oshima | 2011-01-11 |