Issued Patents 2011
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8075155 | Electric power tool | Jiro Suzuki, Takuya Kusakawa | 2011-12-13 |
| 8064066 | Method and apparatus for measuring displacement of a sample to be inspected using an interference light | Toshihiko Nakata, Shuichi Baba, Yasuhiro Yoshitake, Mineo Nomoto | 2011-11-22 |
| 8063939 | Image processing device, image picking-up device, image processing method, and program | Jun Murayama, Atsushi Ito, Seiji Kobayashi, Yoichi Yagasaki, Kenji Tanaka | 2011-11-22 |
| 8013989 | Defects inspecting apparatus and defects inspecting method | Sachio Uto, Minori Noguchi, Hidetoshi Nishiyama, Yoshimasa Ohshima, Akira Hamamatsu +2 more | 2011-09-06 |
| 8011230 | Scanning probe microscope | Toru Kurenuma, Hiroshi Kuroda, Takafumi Morimoto, Shuichi Baba, Toshihiko Nakata +2 more | 2011-09-06 |
| 8005051 | Re-transmission control method and relay station apparatus in a relay communication system | — | 2011-08-23 |
| 8000648 | Radio communications system and antenna pattern switching | Makoto Yoshida | 2011-08-16 |
| 7990910 | Mobile station and reception quality measurement method | — | 2011-08-02 |
| 7966867 | Scanning probe microscope | Shuichi Baba, Toshihiko Nakata | 2011-06-28 |
| 7957579 | Pattern inspection method and apparatus | Takashi Hiroi, Chie Shishido, Aritoshi Sugimoto, Maki Tanaka, Hiroshi Miyai +2 more | 2011-06-07 |
| 7896098 | Power tools | Hitoshi Suzuki | 2011-03-01 |
| 7894658 | Pattern inspection method and apparatus | Takashi Hiroi, Chie Shishido, Aritoshi Sugimoto, Maki Tanaka, Hiroshi Miyai +2 more | 2011-02-22 |
| 7892445 | Wafer electrical discharge control using argon free dechucking gas | David Wei, Howard Dang, Sean S. Kang, Kenji Takeshita, Mayumi Block +2 more | 2011-02-22 |
| 7871309 | Polishing pad | Kazuyuki Ogawa, Tetsuo Shimomura, Atsushi Kazuno, Yoshiyuki Nakai, Takatoshi Yamada +1 more | 2011-01-18 |