Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8064066 | Method and apparatus for measuring displacement of a sample to be inspected using an interference light | Toshihiko Nakata, Masahiro Watanabe, Yasuhiro Yoshitake, Mineo Nomoto | 2011-11-22 |
| 8011230 | Scanning probe microscope | Masahiro Watanabe, Toru Kurenuma, Hiroshi Kuroda, Takafumi Morimoto, Toshihiko Nakata +2 more | 2011-09-06 |
| 7966867 | Scanning probe microscope | Masahiro Watanabe, Toshihiko Nakata | 2011-06-28 |