DH

David V. Horak

IBM: 22 patents #37 of 9,568Top 1%
FS Freeescale Semiconductor: 1 patents #222 of 817Top 30%
📍 South Burlington, VT: #1 of 184 inventorsTop 1%
🗺 Vermont: #5 of 615 inventorsTop 1%
Overall (2011): #463 of 364,097Top 1%
23
Patents 2011

Issued Patents 2011

Showing 1–23 of 23 patents

Patent #TitleCo-InventorsDate
8084311 Method of forming replacement metal gate with borderless contact and structure thereof Su Chen Fan, Theodorus E. Standaert 2011-12-27
8039334 Shared gate for conventional planar device and horizontal CNT Toshiharu Furukawa, Mark C. Hakey, Steven J. Holmes, Charles W. Koburger, III, Mark E. Masters 2011-10-18
8030202 Temporary etchable liner for forming air gap Elbert E. Huang, Charles W. Koburger, III, Shom Ponoth 2011-10-04
8021974 Structure and method for back end of the line integration Chih-Chao Yang, Takeshi Nogami, Shom Ponoth 2011-09-20
8008669 Programmable anti-fuse structure with DLC dielectric layer Chih-Chao Yang, Takeshi Nogami, Shom Ponoth 2011-08-30
8004024 Field effect transistor Toshiharu Furukawa, Mark C. Hakey, Steven J. Holmes, Charles W. Koburger, III 2011-08-23
7994575 Metal-oxide-semiconductor device structures with tailored dopant depth profiles Toshiharu Furukawa, Mark C. Hakey, Steven J. Holmes, Charles W. Koburger, III, Larry Nesbit 2011-08-09
7989222 Method of making integrated circuit chip utilizing oriented carbon nanotube conductive layers Toshiharu Furukawa, Mark C. Hakey, Steven J. Holmes, Charles W. Koburger, III, Peter H. Mitchell 2011-08-02
7985643 Semiconductor transistors with contact holes close to gates Toshiharu Furukawa, Mark C. Hakey, Steven J. Holmes, Charles W. Koburger, III, William R. Tonti 2011-07-26
7965540 Structure and method for improving storage latch susceptibility to single event upsets Ethan H. Cannon, Toshiharu Furukawa, Charles W. Koburger, III, Jack A. Mandelman 2011-06-21
7955968 Pseudo hybrid structure for low K interconnect integration Pak K. Leung, Terry G. Sparks, Stephen M. Gates 2011-06-07
7951660 Methods for fabricating a metal-oxide-semiconductor device structure Toshiharu Furukawa, Mark C. Hakey, Steven J. Holmes, Charles W. Koburger, III, Larry Nesbit 2011-05-31
7943919 Integrated circuit with upstanding stylus Chung H. Lam 2011-05-17
7943480 Sub-lithographic dimensioned air gap formation and related structure Daniel C. Edelstein, Nicholas C. M. Fuller, Elbert E. Huang, Wai-Kin Li, Anthony D. Lisi +2 more 2011-05-17
7932549 Carbon nanotube conductor for trench capacitors Steven J. Holmes, Toshiharu Furukawa, Mark C. Hakey, Charles W. Koburger, III, Larry Nesbit 2011-04-26
7928012 Integrated circuit with upstanding stylus Chung H. Lam 2011-04-19
7928570 Interconnect structure Shom Ponoth, Takeshi Nogami, Chih-Chao Yang 2011-04-19
7928420 Phase change tip storage cell Chung H. Lam, Hon-Sum Philip Wong 2011-04-19
7922796 Chemical and particulate filters containing chemically modified carbon nanotube structures Steven J. Holmes, Mark C. Hakey, James G. Ryan 2011-04-12
7923202 Layer patterning using double exposure processes in a single photoresist layer Toshiharu Furukawa, Mark C. Hakey, Steven J. Holmes, Charles W. Koburger, III 2011-04-12
7898045 Passive electrically testable acceleration and voltage measurement devices Toshiharu Furukawa, Mark C. Hakey, Steven J. Holmes, Charles W. Koburger, III, Leah Pastel 2011-03-01
7892968 Via gouging methods and related semiconductor structure Shyng-Tsong Chen, Steven J. Holmes, Takeshi Nogami, Shom Ponoth, Chih-Chao Yang 2011-02-22
7889317 Immersion lithography with equalized pressure on at least projection optics component and wafer Toshiharu Furukawa, Mark C. Hakey, Steven J. Holmes, Peter H. Mitchell 2011-02-15