Issued Patents 2011
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8039334 | Shared gate for conventional planar device and horizontal CNT | Toshiharu Furukawa, Mark C. Hakey, Steven J. Holmes, David V. Horak, Mark E. Masters | 2011-10-18 |
| 8030202 | Temporary etchable liner for forming air gap | David V. Horak, Elbert E. Huang, Shom Ponoth | 2011-10-04 |
| 8009268 | Immersion optical lithography system having protective optical coating | Steven J. Holmes, Toshiharu Furukawa, Naim Moumen | 2011-08-30 |
| 8004024 | Field effect transistor | Toshiharu Furukawa, Mark C. Hakey, Steven J. Holmes, David V. Horak | 2011-08-23 |
| 7994575 | Metal-oxide-semiconductor device structures with tailored dopant depth profiles | Toshiharu Furukawa, Mark C. Hakey, Steven J. Holmes, David V. Horak, Larry Nesbit | 2011-08-09 |
| 7989222 | Method of making integrated circuit chip utilizing oriented carbon nanotube conductive layers | Toshiharu Furukawa, Mark C. Hakey, Steven J. Holmes, David V. Horak, Peter H. Mitchell | 2011-08-02 |
| 7985643 | Semiconductor transistors with contact holes close to gates | Toshiharu Furukawa, Mark C. Hakey, Steven J. Holmes, David V. Horak, William R. Tonti | 2011-07-26 |
| 7965540 | Structure and method for improving storage latch susceptibility to single event upsets | Ethan H. Cannon, Toshiharu Furukawa, David V. Horak, Jack A. Mandelman | 2011-06-21 |
| 7951660 | Methods for fabricating a metal-oxide-semiconductor device structure | Toshiharu Furukawa, Mark C. Hakey, Steven J. Holmes, David V. Horak, Larry Nesbit | 2011-05-31 |
| 7936017 | Reduced floating body effect without impact on performance-enhancing stress | William F. Clark, Jr., Toshiharu Furukawa, Xuefeng Hua, Robert R. Robison | 2011-05-03 |
| 7932549 | Carbon nanotube conductor for trench capacitors | Steven J. Holmes, Toshiharu Furukawa, Mark C. Hakey, David V. Horak, Larry Nesbit | 2011-04-26 |
| 7932167 | Phase change memory cell with vertical transistor | Toshiharu Furukawa, John G. Gaudiello, Mark C. Hakey, Steven J. Holmes, David V. Horak +1 more | 2011-04-26 |
| 7923202 | Layer patterning using double exposure processes in a single photoresist layer | Toshiharu Furukawa, Mark C. Hakey, Steven J. Holmes, David V. Horak | 2011-04-12 |
| 7898045 | Passive electrically testable acceleration and voltage measurement devices | Toshiharu Furukawa, Mark C. Hakey, Steven J. Holmes, David V. Horak, Leah Pastel | 2011-03-01 |