Issued Patents 2011
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8054099 | Method and apparatus for reducing radiation and cross-talk induced data errors | Manuel F. Cabanas-Holmen, Salim A. Rabaa | 2011-11-08 |
| 8035200 | Neutralization of trapped charge in a charge accumulation layer of a semiconductor structure | John M. Aitken, Alvin W. Strong | 2011-10-11 |
| 7989865 | Deep trench capacitor for SOI CMOS devices for soft error immunity | John E. Barth, Jr., Kerry Bernstein, Francis R. White | 2011-08-02 |
| 7965540 | Structure and method for improving storage latch susceptibility to single event upsets | Toshiharu Furukawa, David V. Horak, Charles W. Koburger, III, Jack A. Mandelman | 2011-06-21 |
| 7943482 | Method for semiconductor device having radiation hardened insulators and design structure thereof | John M. Aitken | 2011-05-17 |
| 7935609 | Method for fabricating semiconductor device having radiation hardened insulators | John M. Aitken | 2011-05-03 |
| 7888959 | Apparatus and method for hardening latches in SOI CMOS devices | AJ KleinOsowski, K. Paul Muller, Tak H. Ning, Philip J. Oldiges, Leon Sigal +2 more | 2011-02-15 |
| 7881135 | Method for QCRIT measurement in bulk CMOS using a switched capacitor circuit | Alan J. Drake, Fadi H. Gebara, John P. Keane, AJ KleinOsowski | 2011-02-01 |
| 7875854 | Design structure for alpha particle sensor in SOI technology and structure thereof | Michael J. Hauser, Timothy D. Sullivan | 2011-01-25 |