Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7949482 | Delay-based bias temperature instability recovery measurements for characterizing stress degradation and recovery | Fadi H. Gebara, Jerry D. Hayes, Sani R. Nassif, Jeremy D. Schaub | 2011-05-24 |
| 7881135 | Method for QCRIT measurement in bulk CMOS using a switched capacitor circuit | Ethan H. Cannon, Alan J. Drake, Fadi H. Gebara, AJ KleinOsowski | 2011-02-01 |