Issued Patents 2011
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7962874 | Method and system for evaluating timing in an integrated circuit | Eric A. Foreman, Peter A. Habitz, David J. Hathaway, Anthony D. Polson | 2011-06-14 |
| 7949482 | Delay-based bias temperature instability recovery measurements for characterizing stress degradation and recovery | Fadi H. Gebara, John P. Keane, Sani R. Nassif, Jeremy D. Schaub | 2011-05-24 |
| 7868640 | Array-based early threshold voltage recovery characterization measurement | Kanak B. Agarwal, Nazmul Habib, John G. Massey, Alvin W. Strong | 2011-01-11 |
| 7870525 | Slack sensitivity to parameter variation based timing analysis | Eric A. Foreman, Peter A. Habitz, David J. Hathaway, Jeffrey H. Oppold, Anthony D. Polson | 2011-01-11 |
| 7865861 | Method of generating wiring routes with matching delay in the presence of process variation | Peter A. Habitz, David J. Hathaway, Anthony D. Polson | 2011-01-04 |