KA

Kanak B. Agarwal

IBM: 3 patents #1,237 of 9,568Top 15%
🗺 Texas: #955 of 11,512 inventorsTop 9%
Overall (2011): #44,398 of 364,097Top 15%
3
Patents 2011

Issued Patents 2011

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
7966535 Secure scan design 2011-06-21
7917316 Test system and computer program for determining threshold voltage variation using a device array Sani R. Nassif 2011-03-29
7868640 Array-based early threshold voltage recovery characterization measurement Nazmul Habib, Jerry D. Hayes, John G. Massey, Alvin W. Strong 2011-01-11