Issued Patents 2011
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7971176 | Method for testing integrated circuits | Rao H. Desineni, Maroun Kassab, Franco Motika | 2011-06-28 |
| 7898045 | Passive electrically testable acceleration and voltage measurement devices | Toshiharu Furukawa, Mark C. Hakey, Steven J. Holmes, David V. Horak, Charles W. Koburger, III | 2011-03-01 |
| 7895487 | Scan chain diagnostics using logic paths | Leendert M. Huisman | 2011-02-22 |
| 7895545 | Methods for designing a product chip a priori for design subsetting, feature analysis, and yield learning | John M. Cohn, Gustavo E. Tellez | 2011-02-22 |