Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7971176 | Method for testing integrated circuits | Maroun Kassab, Franco Motika, Leah Pastel | 2011-06-28 |
| 7870519 | Method for determining features associated with fails of integrated circuits | Maroun Kassab, Leah Pfeifer Pastel | 2011-01-11 |