Issued Patents 2005
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6965429 | Method of reviewing detected defects | Toshifumi Honda, Hirohito Okuda | 2005-11-15 |
| 6958971 | Method of retrieving information with layer identification data from a multi-layered optical disk | Isao Satoh, Yoshihisa Fukushima, Yasushi Azumatani, Hiroshi Hamasaka | 2005-10-25 |
| 6947587 | Defect inspection method and apparatus | Shunji Maeda, Kenji Oka, Yukihiro Shibata, Minoru Yoshida, Chie Shishido +2 more | 2005-09-20 |
| 6938162 | Optical disk, optical disk recording and reproducing apparatus, method for recording, reproducing and deleting data on optical disk, and information processing system | Takahiro Nagai, Hideshi Ishihara, Takashi Yumiba, Mamoru Shoji, Mitsuaki Oshima +6 more | 2005-08-30 |
| 6909930 | Method and system for monitoring a semiconductor device manufacturing process | Chie Shishido, Masahiro Watanabe, Yasuhiro Yoshitake, Shunichi Matsumoto, Takashi Iizumi +3 more | 2005-06-21 |
| 6876445 | Method for analyzing defect data and inspection apparatus and review system | Hisae Shibuya | 2005-04-05 |
| 6875984 | Bio electron microscope and observation method of specimen | Hiroshi Kakibayashi, Shigeyuki Hosoki, Ryo Miyake, Kuniyasu Nakamura, Mitsugu Sato +1 more | 2005-04-05 |
| 6870169 | Method and apparatus for analyzing composition of defects | Kenji Obara, Hisae Shibuya, Naoki Hosoya | 2005-03-22 |
| 6865288 | Pattern inspection method and apparatus | Chie Shishido, Masahiro Watanabe, Hiroshi Miyai | 2005-03-08 |
| RE38706 | Recording defect substitution method of a disc-shaped recording medium, and a recording and reproducing apparatus for a disc-shaped recording medium | Takahiro Nagai, Yoshihisa Fukushima, Shunji Ohara, Isao Satoh | 2005-02-22 |
| 6855930 | Defect inspection apparatus and defect inspection method | Hirohito Okuda, Toshifumi Honda | 2005-02-15 |
| 6841403 | Method for manufacturing semiconductor devices and method and its apparatus for processing detected defect data | Maki Tanaka, Shunji Maeda, Minori Noguchi, Takafumi Okabe, Chie Shishido | 2005-01-11 |