Issued Patents 2005
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6979821 | Scanning electron microscope | Naomasa Suzuki, Toshiro Kubo, Noriaki Arai, Hideo Todokoro, Yoichi Ose | 2005-12-27 |
| 6963069 | Charged particle beam device | Yuusuke Tanba, Kaname Takahashi, Shunya Watanabe, Mine Nakagawa, Atsushi Muto +1 more | 2005-11-08 |
| 6963067 | Scanning electron microscope and sample observing method using it | Shuichi Takeuchi, Mine Nakagawa, Atsushi Takane, Kazutaka Nimura | 2005-11-08 |
| 6956211 | Charged particle beam apparatus and charged particle beam irradiation method | Hideo Todokoro, Yoichi Ose, Makoto Ezumi, Noriaki Arai, Takashi Doi | 2005-10-18 |
| 6936818 | Charged particle beam apparatus | Atsushi Takane, Haruo Yoda, Hideo Todokoro, Fumio Mizuno, Shoji Yoshida +2 more | 2005-08-30 |
| 6885001 | Scanning electron microscope | Yoichi Ose, Hideo Todokoro, Makoto Ezumi | 2005-04-26 |
| 6875984 | Bio electron microscope and observation method of specimen | Hiroshi Kakibayashi, Shigeyuki Hosoki, Yuji Takagi, Ryo Miyake, Kuniyasu Nakamura +1 more | 2005-04-05 |
| 6864493 | Charged particle beam alignment method and charged particle beam apparatus | Tadashi Otaka, Makoto Ezumi, Atsushi Takane, Shoji Yoshida, Satoru Yamaguchi +1 more | 2005-03-08 |
| 6864482 | Electron beam apparatus | Hideo Todokoro | 2005-03-08 |
| 6855931 | Scanning electron microscope and sample observation method using the same | Tetsuya Sawahata | 2005-02-15 |
| 6838667 | Method and apparatus for charged particle beam microscopy | Ruriko Tsuneta, Masanari Koguchi, Mari Nozoe, Muneyuki Fukuda | 2005-01-04 |