Issued Patents 2005
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6979821 | Scanning electron microscope | Naomasa Suzuki, Toshiro Kubo, Noriaki Arai, Mitsugu Sato, Yoichi Ose | 2005-12-27 |
| 6956212 | Electron microscope observation system and observation method | — | 2005-10-18 |
| 6956211 | Charged particle beam apparatus and charged particle beam irradiation method | Mitsugu Sato, Yoichi Ose, Makoto Ezumi, Noriaki Arai, Takashi Doi | 2005-10-18 |
| 6946656 | Sample electrification measurement method and charged particle beam apparatus | Makoto Ezumi, Yoichi Ose, Akira Ikegami, Tatsuaki Ishijima, Takahiro Sato +2 more | 2005-09-20 |
| 6936818 | Charged particle beam apparatus | Atsushi Takane, Haruo Yoda, Fumio Mizuno, Shoji Yoshida, Mitsuji Ikeda +2 more | 2005-08-30 |
| 6885001 | Scanning electron microscope | Yoichi Ose, Makoto Ezumi, Mitsugu Sato | 2005-04-26 |
| 6872944 | Scanning electron microscope | Shou Takami, Makoto Ezumi, Osamu Yamada, Yoichi Ose, Tomohiro Kudo | 2005-03-29 |
| 6872943 | Method for determining depression/protrusion of sample and charged particle beam apparatus therefor | Atsushi Takane, Satoru Yamaguchi, Osamu Komuro, Yasuhiko Ozawa | 2005-03-29 |
| 6864482 | Electron beam apparatus | Mitsugu Sato | 2005-03-08 |
| 6847038 | Scanning electron microscope | Makoto Ezumi, Yoichi Ose, Naomasa Suzuki | 2005-01-25 |
| 6839200 | Combination perpendicular magnetic head having shield material formed at both ends of an upper pole of a write element | Hisashi Takano, Naoki Koyama, Hideo Tanabe, Eijin Moriwaki, Isamu Yuito +5 more | 2005-01-04 |