Issued Patents 2005
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6956211 | Charged particle beam apparatus and charged particle beam irradiation method | Mitsugu Sato, Hideo Todokoro, Yoichi Ose, Noriaki Arai, Takashi Doi | 2005-10-18 |
| 6946656 | Sample electrification measurement method and charged particle beam apparatus | Yoichi Ose, Akira Ikegami, Hideo Todokoro, Tatsuaki Ishijima, Takahiro Sato +2 more | 2005-09-20 |
| 6936818 | Charged particle beam apparatus | Atsushi Takane, Haruo Yoda, Hideo Todokoro, Fumio Mizuno, Shoji Yoshida +2 more | 2005-08-30 |
| 6885001 | Scanning electron microscope | Yoichi Ose, Hideo Todokoro, Mitsugu Sato | 2005-04-26 |
| 6872944 | Scanning electron microscope | Hideo Todokoro, Shou Takami, Osamu Yamada, Yoichi Ose, Tomohiro Kudo | 2005-03-29 |
| 6864493 | Charged particle beam alignment method and charged particle beam apparatus | Mitsugu Sato, Tadashi Otaka, Atsushi Takane, Shoji Yoshida, Satoru Yamaguchi +1 more | 2005-03-08 |
| 6847038 | Scanning electron microscope | Hideo Todokoro, Yoichi Ose, Naomasa Suzuki | 2005-01-25 |