Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6963067 | Scanning electron microscope and sample observing method using it | Shuichi Takeuchi, Mitsugu Sato, Atsushi Takane, Kazutaka Nimura | 2005-11-08 |
| 6963069 | Charged particle beam device | Yuusuke Tanba, Mitsugu Sato, Kaname Takahashi, Shunya Watanabe, Atsushi Muto +1 more | 2005-11-08 |