Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6965429 | Method of reviewing detected defects | Yuji Takagi, Hirohito Okuda | 2005-11-15 |
| 6855930 | Defect inspection apparatus and defect inspection method | Hirohito Okuda, Yuji Takagi | 2005-02-15 |