KO

Kenji Obara

HI Hitachi: 1 patents #1,056 of 3,189Top 35%
Overall (2005): #159,306 of 245,428Top 65%
1
Patents 2005

Issued Patents 2005

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6870169 Method and apparatus for analyzing composition of defects Yuji Takagi, Hisae Shibuya, Naoki Hosoya 2005-03-22