Issued Patents 2005
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6947276 | Process for producing laminated ceramic capacitor | Kazuki Hirata, Kazuhiro Komatsu, Atsuo Nagai | 2005-09-20 |
| 6947587 | Defect inspection method and apparatus | Shunji Maeda, Yukihiro Shibata, Minoru Yoshida, Chie Shishido, Yuji Takagi +2 more | 2005-09-20 |
| 6888959 | Method of inspecting a semiconductor device and an apparatus thereof | Akira Hamamatsu, Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Takanori Ninomiya +4 more | 2005-05-03 |