Issued Patents 2005
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6975754 | Circuit pattern inspection method and apparatus | Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Asahiro Kuni, Maki Tanaka +2 more | 2005-12-13 |
| 6952492 | Method and apparatus for inspecting a semiconductor device | Maki Tanaka, Masahiro Watanabe, Kenji Watanabe, Mari Nozoe | 2005-10-04 |
| 6943752 | Presentation system, a display device, and a program | Junji Masumoto, Shigekazu Yamagishi | 2005-09-13 |
| 6898305 | Circuit pattern inspection method and apparatus | Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Asahiro Kuni, Maki Tanaka +2 more | 2005-05-24 |
| 6865288 | Pattern inspection method and apparatus | Chie Shishido, Masahiro Watanabe, Yuji Takagi | 2005-03-08 |