KW

Kenji Watanabe

HI Hitachi: 5 patents #97 of 3,189Top 4%
EB Ebara: 4 patents #11 of 253Top 5%
HC Hitachi High-Tech Electronics Engineering Co.: 3 patents #2 of 49Top 5%
Honda Motor Co.: 3 patents #106 of 1,560Top 7%
Canon: 1 patents #971 of 2,436Top 40%
HC Hosokawa Yoko Co.: 1 patents #4 of 9Top 45%
KT Kabushiki Kaisha Toshiba: 1 patents #604 of 1,959Top 35%
Sumitomo Electric Industries: 1 patents #1,290 of 3,632Top 40%
Overall (2005): #278 of 245,428Top 1%
16
Patents 2005

Issued Patents 2005

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
D512669 Rear fender for a motorcycle Martin Gayle Manchester, Yoshihiro Takanashi 2005-12-13
6971550 Spouting structure for liquid container and bag-in-box container Raizo Kuge 2005-12-06
D511718 Motorcycle Martin Gayle Manchester, Yoshihiro Takanashi 2005-11-22
D511585 Tail light for a motorcycle Martin Gayle Manchester, Yoshihiro Takanashi 2005-11-15
6952492 Method and apparatus for inspecting a semiconductor device Maki Tanaka, Masahiro Watanabe, Mari Nozoe, Hiroshi Miyai 2005-10-04
6949735 Beam source Masahiro Hatakeyama, Katsunori Ichiki, Tohru Satake 2005-09-27
6938417 Exhaust heat recovery system Tomonari Ito 2005-09-06
6936835 Method and its apparatus for inspecting particles or defects of a semiconductor device Hidetoshi Nishiyama, Minori Noguchi, Yoshimasa Ohshima, Akira Hamamatsu, Tetsuya Watanabe +1 more 2005-08-30
6909092 Electron beam apparatus and device manufacturing method using same Ichirota Nagahama, Yuichiro Yamazaki, Masahiro Hatakeyama, Tohru Satake, Nobuharu Noji 2005-06-21
6894302 Surface inspection apparatus and method thereof Ichiro Ishimaru, Minori Noguchi, Ichiro Moriyama, Yoshikazu Tanabe, Yasuo Yatsugake +2 more 2005-05-17
6888959 Method of inspecting a semiconductor device and an apparatus thereof Akira Hamamatsu, Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Kenji Oka +4 more 2005-05-03
6876821 Color image forming apparatus and image quality control system Hirotaka Ishii 2005-04-05
6855929 Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former Toshifumi Kimba, Tohru Satake, Tsutomu Karimata, Nobuharu Noji, Takeshi Murakami +6 more 2005-02-15
6853143 Electron beam system and method of manufacturing devices using the system Mamoru Nakasuji, Takao Kato, Tohru Satake, Takeshi Murakami, Nobuharu Noji 2005-02-08
6842540 Surveillance system Masataka Okayama, Harumi Morino, Takeo Tomokane, Koichi Inoue, Tomohisa Kohiyama +1 more 2005-01-11
6838648 Temperature detection unit in a high-frequency heating and cooking apparatus Isao Kasai 2005-01-04